DROP IMPACT OF A TYPICAL PORTABLE ELECTRONIC DEVICE-EXPERIMENTS AND MODELING

【Author】

Ricky S.W.Lee;

【Abstract】

<正>Drop/impact forces may cause severe functional damage to portable electronic products.This paper presents our investigation on the dynamic behaviour of typical portable electronic devices under drop impact loading.First,an idealized system which contained an outer case and a PCB with an attached packaged chip was adopted as specimen.The actual impact force pulses were measured by employing a Hopkinson bar in a dynamic test rig.Dynamic strains at several locations of the PCB were simultaneously recorded to explore the correlation between the dynamic strains and the impact force pulse.Particular attention was paid to the dependence of the dynamic response of the PCB on the impact velocity, the force pulse,as well as the impact orientation.A simplified analytical model is proposed to interpret the experimental results.

【Keywords】

portable electronic products;;drop test;;impact force pulse

References

To explore the background and basis of the node document

Springer Journals Database

Total: 8 articles

  • [1] Goyal,S;Buratynski,E.K, Methods for realistic drop-testing, Int.J.Microcircuits and Electronics Packaging (IJMEP),
  • [2] Lim,C.T;Ang,C.W;Tan,L.B;Seah,S.K.W;Wong,E.H, Drop impact survey of portable electronic products, The 53rd Electronic Components and Technology Conference,27-30 May, 2003.Proceedings,
  • [3] Wu J,;Song G S,et al, Drop/impact simulation and test vali-dation of telecommunication products, Inter Society Con-ference on Thermal Phenomena,
  • [4] Shim V P W;Lim C T, Impact Drop tester for Portable Consumer Products, US Patent No. 09/592,262,

More>>

Similar documents

Documents that have the similar content to the node document

More>>