Characteristic Analysis and Modeling for the Near Field Radiation of FPGA

【Author】

Junping Cheng;Changlin Zhou;Daojie Yu;Zhisheng Qian;Mengjuan Chai;

【Abstract】

To predict the radiation emission of the FPGA,the radiation emission model for the chip is proposed with ICEM and the simulation result is also presented in this paper.The linear near-field surface scan system(LNFS) following electromagnetic compatibility standard is applied to measure the emission.It is illustrated that the simulation results agree with the measurements,so the value of the model for practical application is verified.

【Keywords】

electromagnetic compatibility(EMC);;radiation emission(RC);;LNFS;;FPGA

References

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Springer Journals Database

Total: 9 articles

  • [1] Nestor Berbel;;Raúl Fernández‐García;;Ignacio Gil, Modeling technique of the conducted emission of integrated circuit under different temperatures, Int. J. Numer. Model.,
  • [2] Ramdani, Mohamed;;Sicard, Etienne;;Boyer, Alexandre;;Dhia, Sonia Ben;;Whalen, James J.;;Hubing, Todd H.;;Coenen, Mart;;Wada, Osami, The electromagnetic compatibility of integrated circuits - Past, present, and future, IEEE Transactions on Electromagnetic Compatibility, IEEE Transactions on Electromagnetic Compatibility (IEEE Transactions on Electromagnetic Compatibility)
  • [3] Electronic behavioral specifications of digital integrated circuits I/O buffer information specification, IEC 62014-1,
  • [4] J.Zhang;J.Fan, Source reconstruction for IC radiated emissions based on magnitude-only near-field scanning, IEEE Transactions on Electromagnetic Compatibility, IEEE Transactions on Electromagnetic Compatibility (IEEE Transactions on Electromagnetic Compatibility)

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